| Random addressable 2048/spl times/2048 active pixel image sensor D Scheffer, B Dierickx, G Meynants IEEE Transactions on Electron Devices 44 (10), 1716-1720, 1997 | 177 | 1997 |
| Total dose and displacement damage effects in a radiation-hardened CMOS APS J Bogaerts, B Dierickx, G Meynants, D Uwaerts IEEE Transactions on electron devices 50 (1), 84-90, 2003 | 169 | 2003 |
| Time-delay-integration architectures in CMOS image sensors G Lepage, J Bogaerts, G Meynants IEEE Transactions on Electron Devices 56 (11), 2524-2533, 2009 | 134 | 2009 |
| Near 100% fill factor CMOS active pixels B Dierickx, G Meynants, D Scheffer Proc. IEEE CCD & AIS workshop, P1-P1, 1997 | 109 | 1997 |
| Random addressable active pixel image sensors B Dierickx, D Scheffer, G Meynants, W Ogiers, J Vlummens Advanced Focal Plane Arrays and Electronic Cameras 2950, 2-7, 1996 | 96 | 1996 |
| CMOS active pixel image sensor with CCD performance G Meynants, B Dierickx, D Scheffer Advanced Focal Plane Arrays and Electronic Cameras II 3410, 68-76, 1998 | 95 | 1998 |
| Pixel structure with multiple transfer gates X Wang, G Meynants, B Wolfs US Patent 9,001,245, 2015 | 89 | 2015 |
| Pixel array capable of performing pipelined global shutter operation including a first and second buffer amplifier G Meynants, J Bogaerts US Patent 8,569,671, 2013 | 73 | 2013 |
| Missing pixel correction algorithm for image sensors B Dierickx, G Meynants Advanced Focal Plane Arrays and Electronic Cameras II 3410, 200-203, 1998 | 46 | 1998 |
| Backside illuminated global shutter CMOS image sensors G Meynants, J Bogaerts, X Wang, G Vanhorebeek IEEE Int. Image Sensor Workshop, 305-308, 2011 | 42 | 2011 |
| Near-100% fill factor standard CMOS active pixel B Dierickx, G Meynants, D Scheffer proc. 1997 CCD & AIS workshop P 1, 1997 | 40 | 1997 |
| A 2.2 M CMOS image sensor for high-speed machine vision applications X Wang, J Bogaerts, G Vanhorebeek, K Ruythoren, B Ceulemans, ... Sensors, Cameras, and Systems for Industrial/Scientific Applications XI 7536 …, 2010 | 39 | 2010 |
| Low-power lock-in amplifier for complex impedance measurement J Xu, G Meynants, P Merken 2009 3rd International Workshop on Advances in sensors and Interfaces, 110-114, 2009 | 39 | 2009 |
| Pixel array G Meynants US Patent 9,231,005, 2016 | 34 | 2016 |
| High speed 36 Gbps 12Mpixel global pipelined shutter CMOS image sensor with CDS J Bogaerts IISW, 2011, 335-338, 2011 | 31 | 2011 |
| Pixel binning in CMOS image sensors G Meynants, J Bogaerts Frontiers in Electronic Imaging Conference, 2009 | 27 | 2009 |
| Limitations to the frame rate of high speed image sensors G Meynants, G Lepage, J Bogaerts, G Vanhorebeek, X Wang Proc. Int. Image Sensor Workshop, 153-156, 2009 | 27 | 2009 |
| Irradiation damage tests on backside-illuminated CMOS APS prototypes for the extreme ultraviolet imager on-board solar orbiter A BenMoussa, S Gissot, B Giordanengo, G Meynants, X Wang, B Wolfs, ... IEEE Transactions on Nuclear Science 60 (5), 3907-3914, 2013 | 26 | 2013 |
| Pixel array with individual exposure control using at least two transfer gates for a pixel or pixel region G Meynants US Patent 9,666,618, 2017 | 25 | 2017 |
| A 35 mm 13.89 Million pixel CMOS active pixel image sensor G Meynants, B Dierickx, A Alaerts, D Uwaerts, S Cos, S Noble PICS, 58-61, 2003 | 23 | 2003 |
Ali BenMoussaEuropean Commission (DG ENER)Verified email at ec.europa.eu
