| High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector P Vagovic, D Korytar, A Cecilia, E Hamann, L Sveda, D Pelliccia, ... Journal of synchrotron radiation 20 (1), 153-159, 2013 | 27 | 2013 |
| From single GaAs detector to sensor for radiation imaging camera A Šagátová, B Zaťko, V Nečas, F Dubecký, TL Anh, K Sedlačková, ... Applied Surface Science 461, 3-9, 2018 | 26 | 2018 |
| Extreme ultraviolet tomography using a compact laser-plasma source for 3-D reconstruction of low density objects PW Wachulak, Ł Węgrzyński, Z Zápražný, A Bartnik, T Fok, R Jarocki, ... Optics Letters 39 (3), 532–535, 2014 | 18 | 2014 |
| Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation PW Wachulak, Z Zápražný, A Bartnik, T Fok, R Jarocki, J Kostecki, ... Applied Physics B, 1-11, 2014 | 17 | 2014 |
| X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval P Vagovič, L Švéda, A Cecilia, E Hamann, D Pelliccia, EN Gimenez, ... Optics express 22 (18), 21508-21520, 2014 | 16 | 2014 |
| Cross-sectional TEM study of subsurface damage in SPDT machining of germanium optics D Korytár, Z Zápražný, C Ferrari, C Frigeri, M Jergel, I Maťko, J Kečkeš Applied optics 57 (8), 1940-1943, 2018 | 15 | 2018 |
| Imaging performance of a Timepix detector based on semi-insulating GaAs B Zaťko, Z Zápražný, J Jakůbek, A Šagátová, P Boháček, M Sekáčová, ... Journal of Instrumentation 13 (01), C01034, 2018 | 13 | 2018 |
| Potential use of V-channel Ge (220) monochromators in X-ray metrology and imaging D Korytár, P Vagovic, K Vegso, P Siffalovic, E Dobrocka, W Jark, V Ac, ... Journal of applied crystallography 46 (4), 945-952, 2013 | 10 | 2013 |
| Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications Z Zápražný, D Korytár, M Jergel, P Šiffalovič, E Dobročka, P Vagovič, ... Optical engineering 54 (3), 035101-035101, 2015 | 9 | 2015 |
| Extreme X-ray beam compression for a high-resolution table-top grazing-incidence small-angle X-ray scattering setup M Jergel, P Siffalovic, K Vegso, E Majkova, D Korytár, Z Zaprazny, ... Journal of Applied Crystallography 46 (6), 1544-1550, 2013 | 9 | 2013 |
| Finishing of Ge nanomachined surfaces for X-ray crystal optics M Jergel, Y Halahovets, I Maťko, D Korytár, Z Zápražný, J Hagara, ... The International Journal of Advanced Manufacturing Technology 96, 3603-3617, 2018 | 8 | 2018 |
| Towards high-flux X-ray beam compressing channel-cut monochromators K Végsö, M Jergel, P Šiffalovič, E Majková, D Korytár, Z Zápražný, ... Journal of Applied Crystallography 49 (6), 1885-1892, 2016 | 8 | 2016 |
| Nano-machining for advanced X-ray crystal optics Z Zápražný, D Korytár, M Jergel, P Šiffalovič, Y Halahovets, J Keckes, ... AIP Conference Proceedings 1764 (1), 2016 | 8 | 2016 |
| Development towards high-resolution kHz-speed rotation-free volumetric imaging EM Asimakopoulou, V Bellucci, S Birnsteinova, Z Yao, Y Zhang, I Petrov, ... Optics Express 32 (3), 4413-4426, 2024 | 6 | 2024 |
| First tests of Timepix detectors based on semi-insulating GaAs matrix of different pixel size B Zaťko, D Kubanda, J Žemlička, A Šagátová, Z Zápražný, P Boháček, ... Journal of Instrumentation 13 (02), C02013, 2018 | 6 | 2018 |
| Phase contrast imaging of lightweight objects using microfocus X-ray source and high resolution CCD camera Z Zaprazny, D Korytar, V Ac, P Konopka, J Bielecki Journal of Instrumentation 7 (03), C03005, 2012 | 6 | 2012 |
| Performance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation camera D Kubanda, B Zaťko, A Šagátová, J Žemlička, Z Zápražný, P Boháček, ... Journal of Instrumentation 14 (01), C01023, 2019 | 5 | 2019 |
| Single-distance phase retrieval algorithm for Bragg Magnifier microscope S Hrivňak, J Uličný, L Mikeš, A Cecilia, E Hamann, T Baumbach, L Švéda, ... Optics express 24 (24), 27753-27762, 2016 | 5 | 2016 |
| In situ X-ray reciprocal space mapping for characterization of nanomaterials P Siffalovic, K Vegso, M Hodas, M Jergel, Y Halahovets, M Pelletta, ... X-ray and Neutron Techniques for Nanomaterials Characterization, 507-544, 2016 | 5 | 2016 |
| Characterization of the chips generated by the nanomachining of germanium for X-ray crystal optics Z Zápražný, D Korytár, M Jergel, Y Halahovets, M Kotlár, I Maťko, ... The International Journal of Advanced Manufacturing Technology 102, 2757-2767, 2019 | 4 | 2019 |
Patrik VagovicSenior scientist, Center for Free-Electron Laser Science (CFEL)Overená e-mailová adresa na: desy.de
