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Dusan Korytar
Dusan Korytar
Unknown affiliation
Verified email at savba.sk
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Cited by
Year
Performance of semi-insulating GaAs-based radiation detectors: Role of key physical parameters of base materials
F Dubecký, C Ferrari, D Korytár, E Gombia, V Nečas
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007
332007
Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
D Lübbert, C Ferrari, P Mikulík, P Pernot, L Helfen, N Verdi, D Korytár, ...
Journal of applied crystallography 38 (1), 91-96, 2005
322005
Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
P Mikulík, D Lübbert, D Korytár, P Pernot, T Baumbach
Journal of Physics D: Applied Physics 36 (10A), A74, 2003
292003
High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector
P Vagovič, D Korytar, A Cecilia, E Hamann, L Švéda, D Pelliccia, ...
Journal of Synchrotron Radiation 20 (1), 153-159, 2013
272013
High diffraction efficiency in crystals curved by surface damage
C Ferrari, E Buffagni, E Bonnini, D Korytar
Journal of Applied Crystallography 46 (6), 1576-1581, 2013
262013
Two-dimensional x-ray magnification based on a monolithic beam conditioner
D Korytár, P Mikulík, C Ferrari, J Hrdý, T Baumbach, A Freund, A Kubena
Journal of Physics D: Applied Physics 36 (10A), A65, 2003
222003
Experimental and computer simulated Makyoh images of semiconductor wafers
D Korytár, M Hrivnák
Japanese journal of applied physics 32 (2R), 693, 1993
201993
In-line Bragg magnifier based on V-shaped germanium crystals
P Vagovič, D Korytar, P Mikulík, A Cecilia, C Ferrari, Y Yang, D Hänschke, ...
Journal of Synchrotron Radiation 18 (5), 753-760, 2011
182011
Study of residual strains in wafer crystals by means of lattice tilt mapping
C Ferrari, D Korytar, J Kumar
Il nuovo cimento D 19, 165-173, 1997
181997
Extreme ultraviolet tomography using a compact laser–plasma source for 3D reconstruction of low density objects
PW Wachulak, Ł Węgrzyński, Z Zápražný, A Bartnik, T Fok, R Jarocki, ...
Optics Letters 39 (3), 532-535, 2014
172014
Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation
PW Wachulak, Ł Węgrzyński, Z Zápražný, A Bartnik, T Fok, R Jarocki, ...
Applied Physics B 117, 253-263, 2014
162014
X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval
P Vagovič, L Švéda, A Cecilia, E Hamann, D Pelliccia, EN Gimenez, ...
Optics express 22 (18), 21508-21520, 2014
162014
Cross-sectional TEM study of subsurface damage in SPDT machining of germanium optics
D Korytár, Z Zápražný, C Ferrari, C Frigeri, M Jergel, I Maťko, J Kečkeš
Applied optics 57 (8), 1940-1943, 2018
142018
An x-ray diffraction study of the lattice strain relaxation in MOVPE GaAs/Ge heterostructures
G Attolini, C Bocchi, P Franzosi, D Korytar, C Pelosi
Journal of Physics D: Applied Physics 28 (4A), A129, 1995
141995
Imaging performance of a Timepix detector based on semi-insulating GaAs
B Zaťko, Z Zápražný, J Jakůbek, A Šagátová, P Boháček, M Sekáčová, ...
Journal of Instrumentation 13 (01), C01034, 2018
132018
Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties
B Zaťko, L Hrubčín, A Šagátová, J Osvald, P Boháček, Z Zápražný, ...
Applied Surface Science 461, 276-280, 2018
122018
X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
C Ferrari, F Germini, D Korytár, P Mikulík, L Peverini
Journal of Applied Crystallography 44 (2), 353-358, 2011
122011
Point-like and extended defects in Si and GaAs
D Korytar
Journal of crystal growth 126 (1), 30-40, 1993
121993
Potential use of V-channel Ge (220) monochromators in X-ray metrology and imaging
D Korytár, P Vagovič, K Végsö, P Šiffalovič, E Dobročka, W Jark, V Áč, ...
Journal of Applied Crystallography 46 (4), 945-952, 2013
102013
X-ray Multiple-Beam Analysis in High-Resolution Diffractometry of III–V Heterostructures
D Korytar, C Ferrari, Z Bochníček
Journal of applied crystallography 31 (4), 570-573, 1998
101998
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