| Performance of semi-insulating GaAs-based radiation detectors: Role of key physical parameters of base materials F Dubecký, C Ferrari, D Korytár, E Gombia, V Nečas Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007 | 32 | 2007 |
| Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging D Lübbert, C Ferrari, P Mikulík, P Pernot, L Helfen, N Verdi, D Korytár, ... Journal of applied crystallography 38 (1), 91-96, 2005 | 32 | 2005 |
| Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping P Mikulík, D Lübbert, D Korytár, P Pernot, T Baumbach Journal of Physics D: Applied Physics 36 (10A), A74, 2003 | 29 | 2003 |
| High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector P Vagovič, D Korytar, A Cecilia, E Hamann, L Švéda, D Pelliccia, ... Journal of Synchrotron Radiation 20 (1), 153-159, 2013 | 27 | 2013 |
| High diffraction efficiency in crystals curved by surface damage C Ferrari, E Buffagni, E Bonnini, D Korytar Journal of Applied Crystallography 46 (6), 1576-1581, 2013 | 25 | 2013 |
| Two-dimensional x-ray magnification based on a monolithic beam conditioner D Korytár, P Mikulík, C Ferrari, J Hrdý, T Baumbach, A Freund, A Kubena Journal of Physics D: Applied Physics 36 (10A), A65, 2003 | 22 | 2003 |
| Experimental and computer simulated Makyoh images of semiconductor wafers D Korytár, M Hrivnák Japanese journal of applied physics 32 (2R), 693, 1993 | 20 | 1993 |
| In-line Bragg magnifier based on V-shaped germanium crystals P Vagovič, D Korytar, P Mikulík, A Cecilia, C Ferrari, Y Yang, D Hänschke, ... Journal of Synchrotron Radiation 18 (5), 753-760, 2011 | 19 | 2011 |
| Extreme ultraviolet tomography using a compact laser–plasma source for 3D reconstruction of low density objects PW Wachulak, Ł Węgrzyński, Z Zápražný, A Bartnik, T Fok, R Jarocki, ... Optics Letters 39 (3), 532-535, 2014 | 18 | 2014 |
| Study of residual strains in wafer crystals by means of lattice tilt mapping C Ferrari, D Korytar, J Kumar Il nuovo cimento D 19, 165-173, 1997 | 18 | 1997 |
| Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation PW Wachulak, Ł Węgrzyński, Z Zápražný, A Bartnik, T Fok, R Jarocki, ... Applied Physics B 117, 253-263, 2014 | 17 | 2014 |
| X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval P Vagovič, L Švéda, A Cecilia, E Hamann, D Pelliccia, EN Gimenez, ... Optics express 22 (18), 21508-21520, 2014 | 16 | 2014 |
| Cross-sectional TEM study of subsurface damage in SPDT machining of germanium optics D Korytár, Z Zápražný, C Ferrari, C Frigeri, M Jergel, I Maťko, J Kečkeš Applied optics 57 (8), 1940-1943, 2018 | 15 | 2018 |
| An x-ray diffraction study of the lattice strain relaxation in MOVPE GaAs/Ge heterostructures G Attolini, C Bocchi, P Franzosi, D Korytar, C Pelosi Journal of Physics D: Applied Physics 28 (4A), A129, 1995 | 14 | 1995 |
| Imaging performance of a Timepix detector based on semi-insulating GaAs B Zaťko, Z Zápražný, J Jakůbek, A Šagátová, P Boháček, M Sekáčová, ... Journal of Instrumentation 13 (01), C01034, 2018 | 13 | 2018 |
| X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions C Ferrari, F Germini, D Korytár, P Mikulík, L Peverini Journal of Applied Crystallography 44 (2), 353-358, 2011 | 13 | 2011 |
| Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties B Zaťko, L Hrubčín, A Šagátová, J Osvald, P Boháček, Z Zápražný, ... Applied Surface Science 461, 276-280, 2018 | 12 | 2018 |
| Point-like and extended defects in Si and GaAs D Korytar Journal of crystal growth 126 (1), 30-40, 1993 | 11 | 1993 |
| Potential use of V-channel Ge (220) monochromators in X-ray metrology and imaging D Korytár, P Vagovič, K Végsö, P Šiffalovič, E Dobročka, W Jark, V Áč, ... Journal of Applied Crystallography 46 (4), 945-952, 2013 | 10 | 2013 |
| X-ray Multiple-Beam Analysis in High-Resolution Diffractometry of III–V Heterostructures D Korytar, C Ferrari, Z Bochníček Journal of applied crystallography 31 (4), 570-573, 1998 | 10 | 1998 |
Zdenko ZapraznySlovenská akadémia viedOverená e-mailová adresa na: savba.sk
