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Jochen Bruckbauer
Jochen Bruckbauer
Department of Physics, SUPA, University of Strathclyde
Verified email at strath.ac.uk - Homepage
Title
Cited by
Cited by
Year
An Organic Down‐Converting Material for White‐Light Emission from Hybrid LEDs
NJ Findlay, J Bruckbauer, AR Inigo, B Breig, S Arumugam, DJ Wallis, ...
Advanced Materials 26 (43), 7290-7294, 2014
1382014
High resolution cathodoluminescence hyperspectral imaging of surface features in InGaN/GaN multiple quantum well structures
J Bruckbauer, PR Edwards, T Wang, RW Martin
Applied Physics Letters 98 (14), 141908, 2011
922011
High-resolution cathodoluminescence hyperspectral imaging of nitride nanostructures
PR Edwards, LK Jagadamma, J Bruckbauer, C Liu, P Shields, D Allsopp, ...
Microscopy and Microanalysis 18 (6), 1212-1219, 2012
662012
Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN
G Naresh-Kumar, J Bruckbauer, PR Edwards, S Kraeusel, B Hourahine, ...
Microscopy and Microanalysis 20, 55, 2014
372014
Cool to warm white light emission from hybrid inorganic/organic light-emitting diodes
E Taylor-Shaw, E Angioni, NJ Findlay, B Breig, AR Inigo, J Bruckbauer, ...
Journal of Materials Chemistry C 4 (48), 11499-11507, 2016
342016
Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
G Kusch, H Li, PR Edwards, J Bruckbauer, TC Sadler, PJ Parbrook, ...
Applied Physics Letters 104 (9), 092114, 2014
312014
Electron channelling contrast imaging for III-nitride thin film structures
G Naresh-Kumar, D Thomson, M Nouf-Allehiani, J Bruckbauer, ...
Materials Science in Semiconductor Processing 47, 44-50, 2016
292016
Linear oligofluorene-BODIPY structures for fluorescence applications
NJ Findlay, C Orofino-Peña, J Bruckbauer, SET Elmasly, S Arumugam, ...
Journal of Materials Chemistry C 1 (11), 2249-2256, 2013
292013
Implementing fluorescent MOFs as down-converting layers in hybrid light-emitting diodes
E Angioni, RJ Marshall, NJ Findlay, J Bruckbauer, B Breig, DJ Wallis, ...
Journal of Materials Chemistry C 7 (8), 2394-2400, 2019
272019
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope
G Naresh-Kumar, C Mauder, KR Wang, S Kraeusel, J Bruckbauer, ...
Applied Physics Letters 102 (14), 142103, 2013
262013
Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope
G Naresh-Kumar, J Bruckbauer, A Winkelmann, X Yu, B Hourahine, ...
Nano letters 19 (6), 3863-3870, 2019
232019
Probing light emission from quantum wells within a single nanorod
J Bruckbauer, PR Edwards, J Bai, T Wang, RW Martin
Nanotechnology 24 (36), 365704, 2013
192013
Colour tuning in white hybrid inorganic/organic light-emitting diodes
J Bruckbauer, C Brasser, NJ Findlay, PR Edwards, DJ Wallis, PJ Skabara, ...
Journal of Physics D: Applied Physics 49 (40), 405103, 2016
182016
Influence of stress on optical transitions in GaN nanorods containing a single InGaN/GaN quantum disk
YD Zhuang, J Bruckbauer, PA Shields, PR Edwards, RW Martin, ...
Journal of Applied Physics 116 (17), 174305, 2014
182014
Cathodoluminescence hyperspectral imaging of trench-like defects in InGaN/GaN quantum well structures
J Bruckbauer, PR Edwards, SL Sahonta, FCP Massabuau, MJ Kappers, ...
Journal of Physics D: Applied Physics 47 (13), 135107, 2014
152014
Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics
P Ghosh, J Bruckbauer, C Trager-Cowan, LK Jagadamma
Applied Surface Science 592, 152865, 2022
142022
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ...
Semiconductor Science and Technology 35 (5), 054001, 2020
142020
Cathodoluminescence studies of chevron features in semi-polar InGaN/GaN multiple quantum well structures
C Brasser, J Bruckbauer, Y Gong, L Jiu, J Bai, M Warzecha, PR Edwards, ...
Journal of Applied Physics 123 (17), 174502, 2018
142018
A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content
L Spasevski, G Kusch, P Pampili, VZ Zubialevich, DV Dinh, J Bruckbauer, ...
Journal of Physics D: Applied Physic, 2020
122020
The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ...
Photonics Research 7 (11), B73, 2019
122019
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