Joint logic restructuring and pin reordering against NBTI-induced performance degradation KC Wu, D Marculescu Design, Automation, and Test in Europe (DATE) Conference & Exhibition, 75-80, 2009 | 126 | 2009 |
Aging-aware timing analysis and optimization considering path sensitization KC Wu, D Marculescu Design, Automation, and Test in Europe (DATE) Conference & Exhibition, 1572-1577, 2011 | 91 | 2011 |
Soft error rate reduction using redundancy addition and removal KC Wu, D Marculescu Asia and South Pacific Design Automation Conference (ASP-DAC), 559-564, 2008 | 40 | 2008 |
A low-cost, systematic methodology for soft error robustness of logic circuits KC Wu, D Marculescu IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 367-379, 2013 | 39 | 2013 |
Process variability-aware transient fault modeling and analysis N Miskov-Zivanov, KC Wu, D Marculescu International Conference on Computer-Aided Design (ICCAD), 685-690, 2008 | 36 | 2008 |
Power-aware soft error hardening via selective voltage scaling KC Wu, D Marculescu International Conference on Computer Design (ICCD), 301-306, 2008 | 33 | 2008 |
Room-temperature fabricated multilevel nonvolatile lead-free cesium halide memristors for reconfigurable in-memory computing TK Su, WK Cheng, CY Chen, WC Wang, YT Chuang, GH Tan, HC Lin, ... ACS nano 16 (8), 12979-12990, 2022 | 31 | 2022 |
Highly Uniform All‐Vacuum‐Deposited Inorganic Perovskite Artificial Synapses for Reservoir Computing LW Chen, WC Wang, SH Ko, CY Chen, CT Hsu, FC Chiao, TW Chen, ... Advanced Intelligent Systems 3 (1), 2000196, 2021 | 27 | 2021 |
Analysis and mitigation of NBTI-induced performance degradation for power-gated circuits KC Wu, D Marculescu, MC Lee, SC Chang International Symposium on Low Power Electronics and Design (ISLPED), 139-144, 2011 | 24 | 2011 |
Identifying good-dice-in-bad-neighborhoods using artificial neural networks CH Yen, TR Wang, CM Liu, CH Yang, CT Chen, YY Chen, JN Lee, ... IEEE Transactions on Semiconductor Manufacturing, 2024 | 13 | 2024 |
FOX-NAS: fast, on-device and explainable neural architecture search CH Liu, YS Han, YY Sung, Y Lee, HY Chiang, KC Wu Proceedings of the IEEE/CVF International Conference on Computer Vision, 789-797, 2021 | 13 | 2021 |
Sensor-based approximate adder design for accelerating error-tolerant and deep-learning applications NC Huang, SY Chen, KC Wu 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 692-697, 2019 | 12 | 2019 |
BTI-aware sleep transistor sizing algorithm for reliable power gating designs KC Wu, IC Lin, YT Wang, SS Yang IEEE Transactions on Computer-Aided Design (CAD) of Integrated Circuits and …, 2014 | 12 | 2014 |
Mitigating lifetime underestimation: A system-level approach considering temperature variations and correlations between failure mechanisms KC Wu, MC Lee, D Marculescu, SC Chang Design, Automation, and Test in Europe (DATE) Conference & Exhibition, 1269-1274, 2012 | 12 | 2012 |
Re-synthesis for delay variation tolerance SC Chang, CT Hsieh, KC Wu Design Automation Conference (DAC), 814-819, 2004 | 12 | 2004 |
CNN-based stochastic regression for IDDQ outlier identification CH Yen, CT Chen, CY Wen, YY Chen, JN Lee, SY Kao, KC Wu, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2023 | 10 | 2023 |
Aging-aware chip health prediction adopting an innovative monitoring strategy YT Wang, KC Wu, CH Chou, SC Chang Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 9 | 2019 |
The 2020 low-power computer vision challenge X Hu, MC Chang, Y Chen, R Sridhar, Z Hu, Y Xue, Z Wu, P Pi, J Shen, ... 2021 IEEE 3rd International Conference on Artificial Intelligence Circuits …, 2021 | 8 | 2021 |
Fault-tolerance mechanism analysis on NVDLA-based design using open neural network compiler and quantization calibrator SM Liu, L Tang, NC Huang, DY Tsai, MX Yang, KC Wu 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-3, 2020 | 8 | 2020 |
NBTI and leakage reduction using ILP-based approach IC Lin, KH Li, CH Lin, KC Wu IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (9 …, 2014 | 8 | 2014 |