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Anthony Coyette
Anthony Coyette
onsemi
Overená e-mailová adresa na: onsemi.com
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Citované v
Citované v
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Effective DC fault models and testing approach for open defects in analog circuits
B Esen, A Coyette, G Gielen, W Dobbelaere, R Vanhooren
2016 IEEE International Test Conference (ITC), 1-9, 2016
312016
Analog fault coverage improvement using final-test dynamic part average testing
W Dobbelaere, R Vanhooren, W De Man, K Matthijs, A Coyette, B Esen, ...
2016 IEEE International Test Conference (ITC), 1-9, 2016
262016
Design and test of analog circuits towards sub-ppm level
G Gielen, W Dobbelaere, R Vanhooren, A Coyette, B Esen
2014 International Test Conference, 1-2, 2014
252014
Optimization of analog fault coverage by exploiting defect-specific masking
A Coyette, G Gielen, R Vanhooren, W Dobbelaere
2014 19th IEEE European Test Symposium (ETS), 1-6, 2014
212014
Automated testing of mixed-signal integrated circuits by topology modification
A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen
2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015
182015
The process of designing integrated STEM learning materials: Case study towards an evidence-based model
J De Meester, M De Cock, G Langie, W Dehaene
European Journal of STEM Education 6 (1), 2021
162021
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs
W Dobbelaere, F Colle, A Coyette, R Vanhooren, N Xama, J Gomez, ...
2019 IEEE International Test Conference (ITC), 1-4, 2019
142019
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization
A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen
Integration 55, 393-400, 2016
142016
Automatic testing of analog ICs for latent defects using topology modification
N Xama, A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen
2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017
122017
Automatic generation of autonomous built-in observability structures for analog circuits
A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen
2015 20th IEEE European Test Symposium (ETS), 1-6, 2015
102015
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis
A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen
2016 IEEE International Test Conference (ITC), 1-10, 2016
92016
Analog fault coverage improvement using defect-specific masking
W Dobbelaere, R Vanhooren, A Coyette, G Gielen
VOICE conference, 2014
92014
Recent trends and perspectives on defect-oriented testing
P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ...
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
72022
Pinhole latent defect modeling and simulation for defect-oriented analog/mixed-signal testing
J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen
2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020
72020
A very low cost and highly parallel DfT method for analog and mixed-signal circuits
B Esen, A Coyette, N Xama, W Dobbelaere, R Vanhooren, G Gielen
2017 22nd IEEE European Test Symposium (ETS), 1-2, 2017
72017
Machine learning-based defect coverage boosting of analog circuits under measurement variations
N Xama, M Andraud, J Gomez, B Esen, W Dobbelaere, R Vanhooren, ...
ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020
52020
ADAGE: Automatic DfT-assisted generation of test stimuli for mixed-signal integrated circuits
A Coyette, B Esen, N Xama, G Gielen, W Dobbelaere, R Vanhooren
IEEE Design & Test 35 (3), 24-30, 2018
52018
Avoiding mixed-signal field returns by outlier detection of hard-to-detect defects based on multivariate statistics
N Xama, J Raymaekers, M Andraud, J Gomez, W Dobbelaere, ...
2020 IEEE European Test Symposium (ETS), 1-6, 2020
42020
Latent defect screening with visually-enhanced dynamic part average testing
A Coyette, W Dobbelaere, R Vanhooren, N Xama, J Gomez, G Gielen
2020 IEEE European Test Symposium (ETS), 1-6, 2020
42020
Automatic generation of lightweight controllability and observability structures for analog circuits
A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen
2015 International Conference on Synthesis, Modeling, Analysis and …, 2015
32015
Systém momentálne nemôže vykonať operáciu. Skúste to neskôr.
Články 1–20