Antonin Fejfar
TitleCited byYear
Optical absorption and light scattering in microcrystalline silicon thin films and solar cells
A Poruba, A Fejfar, Z Remeš, J Špringer, M Vaněček, J Kočka, J Meier, ...
Journal of Applied Physics 88 (1), 148-160, 2000
2912000
Raman spectroscopy of organic–inorganic halide perovskites
M Ledinský, P Löper, B Niesen, J Holovský, SJ Moon, JH Yum, ...
The journal of physical chemistry letters 6 (3), 401-406, 2015
1532015
Direct measurement of the deep defect density in thin amorphous silicon films with the ‘‘absolute’’constant photocurrent method
M Vaněček, J Kočka, A Poruba, A Fejfar
Journal of applied physics 78 (10), 6203-6210, 1995
1161995
Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution
B Rezek, J Stuchlık, A Fejfar, J Kočka
Applied physics letters 74 (10), 1475-1477, 1999
941999
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
B Rezek, J Stuchlık, A Fejfar, J Kočka
Journal of applied physics 92 (1), 587-593, 2002
892002
Ultrafast carrier dynamics in microcrystalline silicon probed by time-resolved terahertz spectroscopy
L Fekete, P Kužel, H Němec, F Kadlec, A Dejneka, J Stuchlík, A Fejfar
Physical Review B 79 (11), 115306, 2009
812009
Basic features of transport in microcrystalline silicon
J Kočka, A Fejfar, H Stuchlı́ková, J Stuchlık, P Fojtık, T Mates, B Rezek, ...
Solar energy materials and solar cells 78 (1-4), 493-512, 2003
792003
Size and Purity Control of HPHT Nanodiamonds down to 1 nm
S Stehlik, M Varga, M Ledinsky, V Jirasek, A Artemenko, H Kozak, L Ondic, ...
The Journal of Physical Chemistry C 119 (49), 27708-27720, 2015
692015
Model of transport in microcrystalline silicon
J Kočka, H Stuchlıková, J Stuchlık, B Rezek, T Mates, V Švrček, P Fojtık, ...
Journal of Non-Crystalline Solids 299, 355-359, 2002
562002
Characterization of mixed phase silicon by Raman spectroscopy
M Ledinský, L Fekete, J Stuchlík, T Mates, A Fejfar, J Kočka
Journal of non-crystalline solids 352 (9-20), 1209-1212, 2006
552006
a-Si: H gap states investigated by CPM and SCLC
J Kocka, M Vanecek, F Schauer
Journal of Non-Crystalline Solids 97, 715-722, 1987
451987
Gold micrometer crystals modified with carboranethiol derivatives
T Baše, Z Bastl, M Šlouf, M Klementová, J Šubrt, A Vetushka, ...
The Journal of Physical Chemistry C 112 (37), 14446-14455, 2008
422008
Crystallinity of the mixed phase silicon thin films by Raman spectroscopy
M Ledinský, A Vetushka, J Stuchlík, T Mates, A Fejfar, J Kočka, ...
Journal of Non-Crystalline Solids 354 (19-25), 2253-2257, 2008
422008
Transport anisotropy in microcrystalline silicon studied by measurement of ambipolar diffusion length
V Švrček, I Pelant, J Kočka, P Fojtık, B Rezek, H Stuchlıková, A Fejfar, ...
Journal of Applied Physics 89 (3), 1800-1805, 2001
422001
Passivating electron contact based on highly crystalline nanostructured silicon oxide layers for silicon solar cells
J Stuckelberger, G Nogay, P Wyss, Q Jeangros, C Allebé, F Debrot, ...
Solar Energy Materials and Solar Cells 158, 2-10, 2016
402016
Characterization of grain growth, nature and role of grain boundaries in microcrystalline silicon—review of typical features
J Kočka, T Mates, H Stuchlíková, J Stuchlík, A Fejfar
Thin Solid Films 501 (1-2), 107-112, 2006
392006
Role of grains in protocrystalline silicon layers grown at very low substrate temperatures and studied by atomic force microscopy
T Mates, A Fejfar, I Drbohlav, B Rezek, P Fojtık, K Luterová, J Kočka, ...
Journal of non-crystalline solids 299, 767-771, 2002
382002
Effect of hydrogen passivation on polycrystalline silicon thin films
S Honda, T Mates, M Ledinsky, J Oswald, A Fejfar, J Kočka, T Yamazaki, ...
Thin solid films 487 (1-2), 152-156, 2005
362005
Detailed structural study of low temperature mixed-phase Si films by X-TEM and ambient conductive AFM
T Mates, PCP Bronsveld, A Fejfar, B Rezek, J Kočka, JK Rath, ...
Journal of non-crystalline solids 352 (9-20), 1011-1015, 2006
342006
Transport study of self‐supporting porous silicon
A Fejfar, I Pelant, E Šípek, J Kočka, G Juška, T Matsumoto, Y Kanemitsu
Applied physics letters 66 (9), 1098-1100, 1995
341995
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Articles 1–20