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Fa Wang
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Departure headways at signalized intersections: A log-normal distribution model approach
X Jin, Y Zhang, F Wang, L Li, D Yao, Y Su, Z Wei
Transportation research part C: emerging technologies 17 (3), 318-327, 2009
1502009
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
F Wang, W Zhang, S Sun, X Li, C Gu
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
1162013
A new car-following model yielding log-normal type headways distributions
L Li, W Fa, J Rui, H Jian-Ming, J Yan
Chinese Physics B 19 (2), 020513, 2010
492010
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion
X Li, W Zhang, F Wang, S Sun, C Gu
Proceedings of the International Conference on Computer-Aided Design, 627-634, 2012
422012
Indirect performance sensing for on-chip self-healing of analog and RF circuits
S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (8), 2243-2252, 2014
332014
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits
X Li, F Wang, S Sun, C Gu
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 795-802, 2013
322013
A 18mw, 3.3 db nf, 60ghz lna in 32nm soi cmos technology with autonomic nf calibration
JO Plouchart, F Wang, A Balteanu, B Parker, MAT Sanduleanu, M Yeck, ...
2015 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 319-322, 2015
312015
DREAMS: DFM rule EvAluation using manufactured silicon
RD Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 99-106, 2013
272013
Identifying wafer-level systematic failure patterns via unsupervised learning
MB Alawieh, F Wang, X Li
IEEE transactions on computer-aided design of integrated circuits andá…, 2017
262017
Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion
S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ...
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013
252013
Large-scale statistical performance modeling of analog and mixed-signal circuits
X Li, W Zhang, F Wang
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-8, 2012
242012
Co-learning Bayesian model fusion: efficient performance modeling of analog and mixed-signal circuits using side information
F Wang, M Zaheer, X Li, JO Plouchart, A Valdes-Garcia
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 575-582, 2015
232015
A markov-process inspired ca model of highway traffic
F Wang, L Li, JM Hu, Y Ji, R Ma, R Jiang
International Journal of Modern Physics C 20 (01), 117-131, 2009
212009
Efficient hierarchical performance modeling for integrated circuits via bayesian co-learning
M Alawieh, F Wang, X Li
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
162017
Majority-game based conflict modeling for pedestrians and right-turning vehicles in signalized intersection
Y Ji, J Hu, L Li, F Wang, Y Su, D Yao
2008 IEEE Intelligent Vehicles Symposium, 1191-1196, 2008
152008
Efficient hierarchical performance modeling for analog and mixed-signal circuits via bayesian co-learning
MB Alawieh, F Wang, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 2018
142018
Adaptive circuit design methodology and test applied to millimeter-wave circuits
JO Plouchart, F Wang, X Li, B Parker, M Sanduleanu, A Balteanu, ...
IEEE Design & Test 31 (6), 8-18, 2014
142014
DFM evaluation using IC diagnosis data
RDS Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 2016
122016
Efficient analog circuit optimization using sparse regression and error margining
MB Alawieh, F Wang, R Kanj, X Li, R Joshi
2016 17th International Symposium on Quality Electronic Design (ISQED), 410-415, 2016
112016
Identifying systematic spatial failure patterns through wafer clustering
MB Alawieh, F Wang, X Li
2016 IEEE international symposium on circuits and systems (ISCAS), 910-913, 2016
102016
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